Volume 8, Number 2, June 2008 (ISSN 1598-1657)
     
   
     
    SPECIAL ISSUE ON THE 2008 KOREAN CONFERENCE ON SEMICONDUCTOR      



     
    Editorial                                                                                                                                                                        Jinyong Chung   i  



     
           
    The Effects of Nanocrystalline Silicon Thin Film Thickness on Top Gate Nanocrystalline Silicon Thin Film Transistor Fabricated at 180°C
Dong-Won Kang, Joong-Hyun Park, Sang-Myeon Han, and Min-Koo Han
  111  
           
    Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 nm MOSFETs
Junsoo Kim, Jaehong Lee, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, and Hyungcheol Shin
  115  
           
    Design and Fabrication of Electrostatic Inkjet Head using Silicon Micromachining Technology
Youngmin Kim, Sanguk Son, Jaeyong Choi, Doyoung Byun, and Sukhan Lee
  121  
           
    Core Circuit Technologies for PN-Diode-Cell PRAM
Hee-Bok Kang, Suk-Kyoung Hong, Sung-Joo Hong, Man Young Sung, Bok-Gil Choi, and Jinyong Chung
  128  
           
    Power-Gating Structure with Virtual Power-Rail Monitoring Mechanism
Hyoung-Wook Lee, Hyunjoong Lee, Jong-Kwan Woo, Woo-Yeol Shin, and Suhwan Kim
  134  
           
    X Band 7.5 W MMIC Power Amplifier for Radar Application
Kyung Ai Lee, Jong-hoon Chun, and Songcheol Hong
  139  
           
    Design of a 2.4-GHz Fully Differential Zero-IF CMOS Receiver Employing a Novel Hybrid Balun for Wireless Sensor
Network Shinil Chang, Jubong Park, Kwang-Ho Won, and Hyunchol Shin
  143  
           
    BER Simulator Development for Link Compliance Analysis
Hyun Chul Kang, Woo-Seop Kim, Jae-Wook Lee,
Young-Chan Jang, Hwan-Wook Park, Jonghoon Kim, Jung-Bae Lee, and Chang-Hyun Kim
  150  
           



     
  Design Consideration of Bulk FinFETs with Locally-Separated-Channel Structures for Sub-50 nm DRAM Cell Transistors
Han-A-Reum Jung, Ki-Heung Park, and Jong-Ho Lee
  156  
           
    Study of the Effects of the Antisite Related Defects in Silicon Dioxide of Metal-Oxide-Semiconductor Structure on the Gate Leakage Current
Ling-Feng Mao, Zi-Ou Wang, Ming-Zhen Xu, and Chang-Hua Tan
  164  
           
    Optimizing Effective Channel Length to Minimize Short Channel Effects in Sub-50 nm Single/Double Gate SOI MOSFETs
Sudhansh Sharma and Pawan Kumar
  170  



     
         
  Call Papers on September 2008 Special Issue on Circuits for Wireless and Wireline Communication   178  
     
         



     
           
           
   
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