JSTS Vol3. No2. June. 2003

	Volume 3, Number 2, June 2003(ISSN 1598-1657)


	SPECIAL ISSUE ON THE 2003 KOREAN CONFERENCE ON SEMICONDUCTOR

	Editorial········································································································································ Kinam Kim	i

	Improved Breakdown Voltage Characteristics of In_0.5Ga_0.5P/In_0.22Ga_0.78As/GaAs p-HEMT with an Oxidized GaAs Gate······················································································································ ········I-H. Kang, J-W. Lee, S-J. Kang, S-J. Jo, S-K. In, H-J. Song, J-H. Kim, and J-I. Song	63
	Data Retention Time and Electrical Characteristics of Cell Transistor according to STI materials in 90 nm DRAM············································S.H. Shin, S.H. Lee, Y.S. Kim, J.H. Heo, D.I. Bae. S.H. Hong, S.H. Park, J.W. Lee, J.G. Lee, J.H. Oh, M.S. Kim, C.H. Cho, T.Y. Chung, and Kinam Kim	69
	Novel Robust Structure and High k Dielectric Material for 90 nm DRAM Capacitor··························· ·············································Y.K. Park, Y.S. Ahn, K.H. Lee, C.H. Cho, T.Y. Chung, and Kinam Kim	76
	CCD Image Sensor with Variable Reset Operation····················································································· ····················································································································Sangsik Park and Hyung Soo Uh	83
	High Conversion Gain Q-band Active Sub-harmonic Mixer Using GaAs PHEMT··················· ···········································································································Won-Young Uhm, Bok-Hyung Lee, Sung-Chan Kim, Mun-Kyo Lee, Woo-Suk Sul, Sang-Yong Yi, and Jin-Koo Rhee	89
	Investigation of Oxygen Incorporation in AlGaN/GaN Heterostructures··············································· ·································Ho Won Jang, Jeong Min Baik, and Jong-Lam Lee, Hyun-Joon Shin, and Jung-Hee Lee	96
	Dual Edge-Triggered NAND-Keeper Flip-Flop for High-Performance VLSI······································· ·························································································································Jae-Il Kim and Bai-Sun Kong	102

	Call Papers on September 2003 Special Issue on Device Reliability ····················································	107
	Call Papers on December 2003 Special Issue on SOC Design······························································	108
	Call Papers on March 2004 Special Issue on Scaled Nano Devices····················································	109

	Copyright ⓒ 2003 Institute of Electronics Engineers of Korea All rights reserved.