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Volume 3, Number 1, March 2003(ISSN 1598-1657) |
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SPECIAL ISSUE ON COMPOUND SEMICONDUCTOR |
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Editorial·······························································································Songcheol Hong |
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Analysis of Electrical Properties of Ti/Pt/Au Schottky
Contacts on (n)GaAs Formed by Electron Beam Deposition and RF Sputtering ······B.K. Sehgal, V.R.. Balakrishnan, R..Gulati, and S.P. Tewari
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Progress in Novel Oxides for Gate Dielectrics and Surface Passivation of GaN/AlGaN Heterostructure Field Effect Transistors ·············································C.R. Abernathy, B.P. Gila, A.H. Onstine, S.J. Pearton, Jihyun Kim, B. Luo, R. Mehandru, F. Ren, J. K. Gillespie, R..C. Fitch, J. Sewell, R. Dettmer, G.D. Via, A. Crespo, T.J. Jenkins, and Y. Irokawa
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Effect on 4H-SiC Schottky Rectifiers of Ar Discharges Generated in a Planar Inductively Coupled Plasma Source ········································································P.G. Jung, W. T. Lim, G.S. Cho, M. H. Jeon, J.W. Lee, S. Nigam, F. Ren, G. Y. Chung, M. F. MacMillan, and S. J. Pearton
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40nm
InGaAs HEMT¡¯s with 65% Strained Channel Fabricated with Damage-Free
SiO2/SiNx Side-wall Gate Process ··························································································Dae-Hyun Kim, Suk-Jin Kim, Young-Ho Kim, Sung-Wong Kim, and Kwang-Seok Seo
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Process Optimization for High Frequency Performance of InP-Based Heterojunction Bipolar Transistors················································Yongjoo Song, Yongsik Jeong, and Kyounghoon Yang
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Design of Broad Band Amplifier Using Feedback Technique··························································· |
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On-chip Smart Functions for Efficiency Enhancement of MMIC Power Amplifiers for W-CDMA Handset Applications··············Youn S. Noh, Ji H. Kim, Joon H. Kim, Song G. Kim, and Chul S. Park
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Design Sensitivity in Quasi-One-Dimensional Silicon-Based Photonic Crystalline Waveguides··························Takeshi Kinoshita, Akira Shimizu, Yukio Iida, and Yasuhisa Omura |
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Call Papers on September 2003 Special Issue on Device Reliability ···················································· |
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Call Papers on December 2003 Special Issue on SOC Design······························································
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Call Papers on March 2004 Special Issue on Scaled Nano Devices···················································· |
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Copyright ¨Ï 2003 Institute of Electronics Engineers of Korea All rights reserved.
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