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	Volume 1, Number 3, September 2001(ISSN 1598-1657)

	JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE


	Fabrication Process
	Integration Process and Reliability for SrBi2 Ta2O9-based Ferroelectric Memories ................ ...............B. Yang, S.S. Lee, Y.M. Kang, K.H Noh, S.K. Hong, S.H. Oh, E.Y. Kang, S.W. Lee, J.G. Kim, C.W. Shu, J.Y. Seong, C.G. Lee, N.S. Kang, and Y.J. Park	141

	Devices
	Trapping and Detrapping of Transport Carriers in Silicon Dioxide Under Optically Assisted Electron Injection ......................................................................................Hongseog Kim	158

	Circuits
	Circuit Techniques for Low-Power Data Drivers of TFT-LCDs ............................................. ...........................................................................Byong-Deok Choi and Oh-Kyong Kwon	167

	MEMS
	A High Performance Solenoid-type MEMS Inductor ............................................................ ..................................................Seonho Seok, ]Chul Nam, Wonseo Choi, and Kukjin Chun	182

	A High Density MIM Capacitor in a Standard CMOS Process .............................................. .......................................................................................................Christian Rye Iversen	189
	Analog Delay Locked Loop with Wide Locking Range ......................................................... ................................................................................................................Changsik Yoo	193



	Copyright ⓒ 2001 Institute of Electronics Engineers of Korea All rights reserved.